T Plus | RF Probe Card

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RF Probe Card

Feature

Low Insertion Loss and Return Loss up to 67GHz.

RF Air Coplanar probe (require uniformed pitch and configuration) ,...

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Date: 2016-05-16 03:15:47
Website: http://tplus-co.com

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RF Engineering | P30 RF Probe Cards | Cascade Microtech, Inc.

Probe Card Training

Developed with a subset of features from available Pyramid Probes, plus a simplified design and build process, P30 RF Pyramid Probe card is a superior, cost-effective alternative to coaxial-style RF probe cards for high-volume testing of RF filters and switches. P30's outstanding RF performance, isolation, low ground inductance and...

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Website: https://www.cascademicrotech.com

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誠意實業 | T PLUS RF Probe/Probe Card

T PLUS RF Probe/Probe Card

T PLUS is the international marketing brand of TechnoProbe, a famous Japanese probe card manufacturer. It has accumulated more than 20 years of experience in precision manufacturing of high-frequency measurement probe cards and probes. It has more than dozens of professional manufacturing engineers. With the Keysight measuring instrument PNA-X 2 port up to 325 Ghz and 4...

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Website: http://honestco.com.tw

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Probe Cards | Pyramid Probe Cards | RF/DC/Parametric Test ...

Probe Card Training

Superior electrical and mechanical performance

Pyramid Probe cards are rugged, robust, and well suited for the rigors of high-performance production wafer sort. Its industry-leading signal integrity and mechanical alignment capabilities make these probe cards the perfect fit for multi-die testing for RF wireless, high-speed digital in SiPs, SoCs, and leading edge DC parametric...

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Website: https://www.cascademicrotech.com

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Buy RF Probe Card - 49399758 - ecer.com

Feature

Low Insertion Loss and Return Loss up to 67GHz.

RF Air Coplanar probe (require uniformed pitch and configuration) , OR Custom Fabrication RF Cantilever...

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Website: http://www.ecer.com

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International Contact Technologies Inc.

Worldwide Locations

Welcome

VCT Vertical Contact Technology: For matrix bumps or peripheral pads, with MLC, MLO, hard wired or direct contact space transformers.

Blade type probe cards: Using metal or ceramic...

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Date: 2014-05-19 14:49:46
Website: http://ict-probe.com

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Picoprobe Probe Cards - Ggb INC

DC to 40, 50, 67 or 110 GHz

Mix RF and DC contacts

For MMIC or Module probing

Individually spring loaded contacts

Inexpensive, fast, custom fabrication 3 capacitor bypass locations available

Each probe card is custom made to your layout

Patented coaxial design

FIGURE 1

Probe card with eleven RF Picoprobes and fifteen DC needles.

PICOPROBE® PROBE CARDS by GGB Industries,...

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Date: 2008-05-14 12:42:19
Website: http://www.ggb.com

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Method and apparatus of RFID tag contactless testing ...

A semiconductor wafer includes a plurality of dies. Each of the plurality of dies includes a radio frequency identification (RFID) tag circuit and a coil. The RFID tag circuit includes a tag core, an RF front-end circuit, an ID decoder, a comparator and conductive line for a unique ID. The RF front-end circuit is configured to receive electromagnetic signals through the coil in each of the...

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Website: http://www.freepatentsonline.com

RF Probe Cards - International Contact Technologies Inc.

Worldwide Locations

RF Probe Cards

ICT is ready to work with you to meet your RF requirements using Vertical Contact Technology or stripline ceramic blade technology. The high frequency version of our VCT uses matched impedence transmission lines. This technology has been successfully proven to be capable of up to 10 GHz. The stripline...

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Date: 2014-04-17 18:26:34
Website: http://ict-probe.com

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Picoprobe Model 40A High Performance Microwave RF Probe

Custom configurations available

FIGURE 1

The GGB Industries, Inc., MODEL 40A microwave probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 40A achieves an insertion loss of less than 0.8 db and a return loss of greater than 18 db through 40 GHz.

With its individually spring loaded, Beryllium-Copper, Tungsten, or Nickel tips, the Model...

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Date: 2014-06-18 16:03:02
Website: http://www.ggb.com

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RF Wafer Probing - CWI Technical Sales

·    Designed for IC Design, Design Validation and FA

·    One handed puck control stage movement for fast positioning and micrometer stage

·    Highly reliable platen lift design with three discrete positions; 1µm repeatability

·    20mm Probe Platen adjustment

·    Can support up to 4 RF or 10 DC Positioners

·    Thermal Chuck, Probe Card Holder available as options

·    High Power Microscope...

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Website: http://cwitechsales.com

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Automate RF Spectrum Analyzer test measurements - Huntron ...

Access RF Prober FAQ

Q: What are the primary differences between the Access RF and the Access 2?

A: The Access RF is a modified version of the Huntron Access 2 Prober . The standard probe holder that uses spring probes has been replaced with a special holder for a high quality Langer RF probe. Special high frequency RF cabling from Gore has been installed that connects...

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Date: 2019-01-30 18:10:11
Website: http://www.huntron.com

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Technoprobe | CANTILEVER PROBE CARD

CANTILEVER PROBE CARDS - well beyond the state of the art

The upgrade of our Cantilever products to support our customers with outstanding performance has always been our focus.

Thus on top of maintaining our Cantilever products portfolio, we have conceived advanced solutions to target specific demanding requests.

We can  deliver the advantage of fast turn-around-time Cantilever probe cards to...

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Website: http://www.technoprobe.com

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Production Test RF Calibration for Multi-DUT Probe Cards: How to Get the Most Accurate Measurements

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The most accurate measurement in a multi-site application is to make a calibration substrate that mirrors the multi-site layout. This controls all of the RF...

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Website: https://m.youtube.com

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